Overview
Management
History
Location
Test Socket Development Assistance
Interface Optimization
Probe Card Design Assistance
Time & Frequency Domain Modeling & Measurement
Signal Path Integrity Engineering
Signal Integrity Assessment
Subsystem Component Characterization
Test Socket Characterization
Probe Card Characterization
High Performance Custom Probes
Semi-flexible Probes
Low Impedance Probes
Small Pitch, Low Force Probes
Downloads
Presentations
Workshops
Conferences
Professional Affiliations
MEMS Design Assistance
Contact Design Assistance
Finite Element Analysis
RF Model Development
Socket & Probe Card Performance Assessment


Conferences

Burn-in & Test Socket Workshop™ (BiTS)

BiTS Workshop 2006
BiTS Workshop 2007
BiTS Workshop 2008

IEEE Southwest Test Workshop

IEEE SWTW Workshop 2001
IEEE SWTW Workshop 2007
IEEE SWTW Workshop 2008


      Resources
Downloadas

Presentations
Workshops
Conferences
Professional
Affiliations

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