GateWave Northern, Inc. performs signal integrity assessment of IC test and burn-in sockets, spring probes, and high speed components such as relays and other signal transmission structures. Backplance, load board PCB and IC tester subsystem component characterization are available.

S-parameter analysis of measurements carried out with Vector Network Analyzers (VNA) is complemented by TDR and TDT representations of signal paths. SPICE models as well as generalized frequency domain models are derived from these measurements. Comprehensive test reports explain in detail the tests performed, model characteristics and results obtained.

For quick checks abbreviated tests that focus on specific parameters are available at reduced turnaround time and cost. Custom test fixturing developed on-site allows for quick integration of a given device under test (DUT) into the analysis flow.

• Package/socket characterization
• Spring probe characterization
• Load board characterization
• Backplane connector characterization
• Probe card characterization
• VNA and TDR measurements
• Performance analysis & recommendations for improvement
• Test reports, data and follow-up support


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